ISIS sentronics: Contactless Sensors and Metrology Systems
ISIS sentronics GmbH, of Mannheim, Germany is the developer of patented Spectral Coherence Interferometry (SCI) technology, which the company has successfully deployed in its products for use in a diverse range of applications and markets.
Seeking an alternative to capacitive or radioactive devices for measuring film and coating thickness? The StraDex family of sensors may have just what you're looking for. Capable of measuring not only total thickness, but also thickness of individual layers in co-extrusion applications, StraDex is a precise and cost effective solution for both in-line and off-line uses. Read more...
If your needs require the ability to closely measure surface roughness characteristics, or close tolerance mechanical dimensions (e.g., micro-machined gears), ISIS sentronics' RayDex sensor will fulfill your needs. RayDex is capable of providing users with greater accuracy and higher levels of repeatability than any other competitive sensor technology.
If you work in the semiconductor manufacturing industry and are seeking a better method for measuring feature size on silicon wafers, then SemDex could be the product that will help you accomplish your measurement goals. As with all of the sensors manufactured by ISIS sentronics, SemDex is contactless and based on the company's patented SCI technology.